Mitutoyo MF-U Series 176 Measuring Microscope
MF-UB3017C

• Observation with a clear and flare-less erect image and a wide field of view
• Measuring accuracy that is the highest in its class (and conforms to JIS B 7153)
• Proven high-NA objectives from the FS optical system (long working distance type)
• Integration of metallurgical and measurement microscope functions provides high-resolution observation and high-accuracy measurement solution
• Illumination unit (reflected/transmitted) selectable from a high-intensity LED or halogen bulb (required)
• Variable aperture diaphragm (reflected/ transmitted) allows observation measurement while suppressing light diffraction
• Variety of standardized stages in sizes up to 400 × 200 mm
• Quick-release mechanism useful for moving the stage quickly when measuring workpieces that are large in size or quantity
• High-magnification eyepiece observation up to 4000X
• Low-noise design

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